International Conference (Nagoya University :14)

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  1. Epitaxial Growth of AlxGa1-xN by MOVPE. 17th Int. Conf. on Solid State Devices and Materials, Tokyo, (Japan) Abst. p.6-7, August, 1985 Y. Koide, H. Itoh, N. Sawaki, I. Akasaki, and M. Hashimoto
  2. Formation of Si-SiO2 Interface at Low Temperatures Using Microwave-Excited Plasma. 2nd Int. Conf. on Formation of Semiconductor Interface, Takarazuka, (Japan) Abst. p.161, November, 1988 S. Zaima, T. Kaida, Y. Koide, Y. Yasuda
  3. Growth Prcesses in The Initial Stage of Deposition of Ge Films on (100)Si Surfaces by GeH4 Source Molecular Beam Epitaxy. 9th Int. Conf. on Crystal Growth, Sendai (Japan), Abst. p. 5, August, 1989 Y. Koide, S. Zaima, N. Ohshima, and Y. Yasuda
  4. Formation of a Superstructure in The Initial Stage of Ge Epitaxial Growth on Si(100) Substrate. 5th Int. Conf. on Solid Films and Surfaces, Rhode Island, (USA) Abst. Session 14A, August, 1990 N. Ohshima, Y. Koide, S. Zaima, and Y. Yasuda
  5. Observation of Si-SiO2 Interface States within The Conduction Band by Tunneling Current Spectroscopy. 3rd Int. Conf. on Formation of Semiconductor Interface, Rome, (Italy) Abst. p.168, May, 1991 M. Sakashita, S. Zaima, Y. Koide, and Y. Yasuda
  6. Formation of Interfacial Layers and Electrical Conduction Mechnisms Dominating The Contact Resistivity in Refractory Metal-Metal-Si Contacts. 3rd Int. Conf. on Formation of Semiconductor Interface, Rome, (Italy) Abst. p.89, May, 1991 T. Yamauchi, M. Kataoka, S. Zaima, Y. Koide, and Y. Yasuda
  7. Atomic Mixing Phenomena and Changes in Faceted Structure of Ge Films Grown on (100)Si by Thermal Annealing. 7th Int. Conf. on Vapor Growth and Epitaxy, Nagoya, (Japan) Abst. p.165, July, 1991 N. Ohshima, Y. Koide, S. Zaima, and Y. Yasuda
  8. In-situ RHEED Study on Growth Processes in The Initial Stage of SiGe Alloy Film Deposition by Gas Source Molecular Beam Epitaxy. 7th Int. Conf. on Vapor Growth and Epitaxy, Nagoya, (Japan) Abst. p.238, July, 1991 Y. Koide, F. Furukawa, S. Zaima, and Y. Yasuda
  9. In-situ RHEED Study on The Effect of Light Irradiation on Ge/Si Heteroepitaxial Growth by GeH4 Source Molecular Beam Epitaxy. 3rd Int. Conf. Chemcal Beam Epitaxy and Related Growth Techniques, Oxford (UK), Abst. F6, September, 1991 Y. Koide, K. Itoh, S. Zaima, and Y. Yasuda
  10. Initial Growth of Ge Films on Si(111)7x7 Surfaces by Gas Source Molecular Beam Epitaxy. 1st Int. Conf. on Atomically Controlled Surfaces and Interfaces, Tokyo, (Japan) Abst. p.142, November, 1991 N. Ohshima, S. Zaima, Y. Koide, and Y. Yasuda
  11. Initial Stage of Ge Film Grown on (311)Si by Gas Source Molecular Beam Epitaxy. 10th Int. Conf. on Crystal Growth, San Diego, (USA) Abst. p. 321, August, 1992 Y. Yasuda, K. Itoh, N. Ohshima, Y. Koide, S. Zaima
  12. Growth Behaviors of the Initial Ge Two-dimensional Layers on (100)Si Substrates and Photo-irradiation Effects by GeH4 Source Molecular Beam Epitaxy. 4th Int. Conf. on the Formation of Semiconductor Interfaces, Julich, (Germerny) Abst. July, 1993 M. Okada, Y. Koide, S. Zaima, and Y. Yasuda
  13. Photo-irradiation Effects in the Initial Stage of Si Homoepitaxial Growth by Si2H6 Source MBE. 1st Int. Conf. on Photo-Excited Processes and Applications, Sendai (Japan) Abst. p.156, Ocotber, 1993 . Y.Koide, M.Okada, S.Zaima, and Y.Yasuda
  14. High-spatial Resolution Analysis of Semiconductor Superlattices by nm-sized Electron Probe. 1st Int. Symp. on Control of Interfaces of Semicon-ductor Interfaces, Karuizawa (Japan), Abst. A5, November, 1993. N. Tanaka, Y. Koide, S. Zaima, and Y. Yasuda

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